The Binet-Simon tests are a series of intelligence tests developed in France by Alfred Binet and Theodore Simon in the early 1900s. These tests were developed to identify children who needed special education and were later adapted and translated into English by Lewis Terman. Synonyms for the Binet-Simon tests include intelligence tests, IQ tests, psychometric tests, cognitive assessments, and aptitude tests. These tests are commonly used in schools, universities, and workplaces to assess a person's cognitive abilities, problem-solving skills, and learning potential. Overall, synonyms for the Binet-Simon tests highlight the importance of measuring intelligence and aptitude, especially in areas where these skills are critical for success.