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What is another word for Scanning Electron Microscopy?

Pronunciation: [skˈanɪŋ ɪlˈɛktɹɒn mˈa͡ɪkɹəskəpɪ] (IPA)

Scanning Electron Microscopy (SEM) is a valuable scientific technique used to examine the surface topography and composition of a wide range of materials. It allows for high-resolution imaging by employing a focused beam of electrons that interacts with the sample's surface. This results in the generation of signals such as secondary electrons, backscattered electrons, and X-rays, which enable the creation of detailed images. In terms of synonyms, SEM is often referred to as electron microscopy, electron microprobe analysis, and electron micrography. This technique revolutionized various fields, including materials science, nanotechnology, geology, and biology, providing researchers with valuable insights into the microscopic world.
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What are the opposite words for Scanning Electron Microscopy?

Scanning Electron Microscopy (SEM) is a scientific method used to examine the structural and morphological features of a sample at high magnification. As with any word, there are antonyms for SEM, which are words that are diametrically opposed to its meaning. The antonyms for Scanning Electron Microscopy could be 'gross inspection' or 'naked eye observation,' which implies examining a sample with the naked eye without any magnification or sophisticated instrument. It may also mean using a light microscope to observe the structural and morphological features of the sample, rather than the high magnification of SEM. In essence, the antonyms of SEM are methods that do not require high magnification or the use of sophisticated scientific instruments to observe a sample.

What are the antonyms for Scanning electron microscopy?

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